Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films
出版年份 2012 全文链接
标题
Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films
作者
关键词
-
出版物
PHYSICAL REVIEW B
Volume 85, Issue 2, Pages -
出版商
American Physical Society (APS)
发表日期
2012-01-14
DOI
10.1103/physrevb.85.024113
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films
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- A Strain-Driven Morphotropic Phase Boundary in BiFeO3
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- Single ferroelectric and chiral magnetic domain of single-crystallineBiFeO3in an electric field
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- Spin-glass transition in single-crystalBiFeO3
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