Evidence of quantum confinement effects on interband optical transitions in Si nanocrystals

Photoluminescence from silicon nanostructures: The mutual role of quantum confinement and surface chemistry

(2009) Amir Saar   Journal of Nanophotonics

Coordination imperfection enhanced electron–phonon interaction and band-gap expansion in Si and Ge nanocrystals

(2009) Likun Pan et al.   SCRIPTA MATERIALIA

Anomalous photovoltaic effect in nanocrystalline Si∕SiO2 composites

(2008) H. Levi Aharoni et al.   APPLIED PHYSICS LETTERS

Evolution of the optical properties of Si nanoparticles embedded in SiO2 as function of annealing conditions

(2008) I. Stenger et al.   JOURNAL OF APPLIED PHYSICS

Ellipsometric and Raman spectroscopic study of nanocrystalline silicon thin films prepared by a rf magnetron sputtering technique

(2008) Y Bouizem et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

Classification and control of the origin of photoluminescence from Si nanocrystals

(2008) S. Godefroo et al.   Nature Nanotechnology

Polaronic states in Si nanocrystals embedded in SiO2 matrix

(2008) M. Mahdouani et al.   PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES

Dielectric function and optical transitions of silicon nanocrystals between 0.6 eV and 6.5 eV

(2008) M. Mansour et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Observation of quantum confinement and quantum size effects

(2008) A. C. Diebold et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Charge storage, photoluminescence, and cluster statistics in ensembles of Si quantum dots

(2008) I. V. Antonova et al.   PHYSICAL REVIEW B

Dielectric constant reduction in silicon nanostructures

(2008) Han G. Yoo et al.   PHYSICAL REVIEW B

SiO x layer formation during plasma sputtering of Si and SiO2 targets

(2008) A. N. Karpov et al.   SEMICONDUCTORS

Effect of Si nanoparticles embedded in SiOx on optical properties of the films studied by spectroscopic ellipsometry and photoluminescence spectroscopy

(2007) A. Szekeres et al.   OPTICAL MATERIALS

Structural determination of nanocrystalline Si films using ellipsometry and Raman spectroscopy

(2007) Sanjay K. Ram et al.   THIN SOLID FILMS