Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction

Title
Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 79, Issue 3, Pages -
Publisher
American Physical Society (APS)
Online
2009-01-06
DOI
10.1103/physrevb.79.035301

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