Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

(2009) Rolf Erni et al.   PHYSICAL REVIEW LETTERS

Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles

(2009) D. Alloyeau et al.   ULTRAMICROSCOPY

First-principles study of the diffusion mechanisms of the self-interstitial in germanium

(2008) A Carvalho et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

(2008) B Freitag et al.   MICROSCOPY AND MICROANALYSIS

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

(2008) C. Kisielowski et al.   MICROSCOPY AND MICROANALYSIS

Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires

(2008) Sang Ho Oh et al.   NANO LETTERS

Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

(2008) Jannik C. Meyer et al.   NANO LETTERS