High-resolution STEM imaging with a quadrant detector—Conditions for differential phase contrast microscopy in the weak phase object approximation

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
High-resolution STEM imaging with a quadrant detector—Conditions for differential phase contrast microscopy in the weak phase object approximation
Authors
Keywords
Differential phase contrast, DPC, STEM, High resolution
Journal
ULTRAMICROSCOPY
Volume 148, Issue -, Pages 81-86
Publisher
Elsevier BV
Online
2014-10-09
DOI
10.1016/j.ultramic.2014.09.009

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.