High-resolution STEM imaging with a quadrant detector—Conditions for differential phase contrast microscopy in the weak phase object approximation

标题
High-resolution STEM imaging with a quadrant detector—Conditions for differential phase contrast microscopy in the weak phase object approximation
作者
关键词
Differential phase contrast, DPC, STEM, High resolution
出版物
ULTRAMICROSCOPY
Volume 148, Issue -, Pages 81-86
出版商
Elsevier BV
发表日期
2014-10-09
DOI
10.1016/j.ultramic.2014.09.009

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