Quantitative stress/strain mapping during micropillar compression

In situ electron backscatter diffraction (EBSD) during the compression of micropillars

(2010) C. Niederberger et al.   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

Brittle-to-Ductile Transition in Uniaxial Compression of Silicon Pillars at Room Temperature

(2009) Fredrik Östlund et al.   ADVANCED FUNCTIONAL MATERIALS

Micro-compression testing: A critical discussion of experimental constraints

(2009) D. Kiener et al.   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

In situ SEM indentation experiments: Instruments, methodology, and applications

(2009) Rudy Ghisleni et al.   MICROSCOPY RESEARCH AND TECHNIQUE

Compression of freestanding gold nanostructures: from stochastic yield to predictable flow

(2009) W M Mook et al.   NANOTECHNOLOGY

Comparison of nanoscale measurements of strain and stress using electron back scattered diffraction and confocal Raman microscopy

(2008) Mark D. Vaudin et al.   APPLIED PHYSICS LETTERS

In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope

(2008) K.A. Rzepiejewska-Malyska et al.   JOURNAL OF MATERIALS RESEARCH

In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

(2008) K. Wasmer et al.   JOURNAL OF MATERIALS RESEARCH

Flow stresses and activation volumes for highly deformed nanoposts

(2008) W.M. Mook et al.   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING