Origin of bias stress induced instability of contact resistance in organic thin film transistors

标题
Origin of bias stress induced instability of contact resistance in organic thin film transistors
作者
关键词
-
出版物
ORGANIC ELECTRONICS
Volume 12, Issue 5, Pages 823-826
出版商
Elsevier BV
发表日期
2011-03-05
DOI
10.1016/j.orgel.2011.02.019

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