Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors

Published 2009 View Full Article

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Title
Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 10, Issue 6, Pages 1074-1081
Publisher
Elsevier BV
Online
2009-05-28
DOI
10.1016/j.orgel.2009.05.019

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