Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors

出版年份 2009 全文链接

标题

Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors

作者

关键词

-

出版物

ORGANIC ELECTRONICS

Volume 10, Issue 6, Pages 1074-1081

出版商

Elsevier BV

发表日期

2009-05-28

DOI

10.1016/j.orgel.2009.05.019

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