Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy

Title
Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy
Authors
Keywords
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Journal
OPTICS EXPRESS
Volume 21, Issue 3, Pages 3523
Publisher
The Optical Society
Online
2013-02-06
DOI
10.1364/oe.21.003523

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