Improved single particle localization accuracy with dual objective multifocal plane microscopy

Published 2009 View Full Article

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Title
Improved single particle localization accuracy with dual objective multifocal plane microscopy
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 17, Issue 8, Pages 6881
Publisher
The Optical Society
Online
2009-04-11
DOI
10.1364/oe.17.006881

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