Improved single particle localization accuracy with dual objective multifocal plane microscopy

标题
Improved single particle localization accuracy with dual objective multifocal plane microscopy
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 17, Issue 8, Pages 6881
出版商
The Optical Society
发表日期
2009-04-11
DOI
10.1364/oe.17.006881

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