Effect of the thickness of the TiO x /TiO2 layers on their memristor properties

Title
Effect of the thickness of the TiO x /TiO2 layers on their memristor properties
Authors
Keywords
Complementary Metal Oxide Semiconductor, National Research Centre Kurchatov Institute, Prepared Layer, Artificial Neuron Network, Microscopic Optical System
Journal
TECHNICAL PHYSICS
Volume 60, Issue 1, Pages 112-115
Publisher
Pleiades Publishing Ltd
Online
2015-01-24
DOI
10.1134/s1063784215010077

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