Conductive filament structure in HfO2 resistive switching memory devices

Published 2015 View Full Article

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Title
Conductive filament structure in HfO2 resistive switching memory devices
Authors
Keywords
Resistive switching, Electron energy loss spectroscopy, Conductive filament
Journal
SOLID-STATE ELECTRONICS
Volume 111, Issue -, Pages 161-165
Publisher
Elsevier BV
Online
2015-06-19
DOI
10.1016/j.sse.2015.05.044

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