Investigation of micro-electrical properties of Cu 2 ZnSnSe 4 thin films using scanning probe microscopy

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Title
Investigation of micro-electrical properties of Cu 2 ZnSnSe 4 thin films using scanning probe microscopy
Authors
Keywords
CZTSe, Solar cell, thin film, Grain boundary, Scanning Kelvin probe force microscopy, Scanning spreading resistance microscopy
Journal
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 132, Issue -, Pages 342-347
Publisher
Elsevier BV
Online
2014-10-01
DOI
10.1016/j.solmat.2014.08.046

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