Investigation of micro-electrical properties of Cu 2 ZnSnSe 4 thin films using scanning probe microscopy

标题
Investigation of micro-electrical properties of Cu 2 ZnSnSe 4 thin films using scanning probe microscopy
作者
关键词
CZTSe, Solar cell, thin film, Grain boundary, Scanning Kelvin probe force microscopy, Scanning spreading resistance microscopy
出版物
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 132, Issue -, Pages 342-347
出版商
Elsevier BV
发表日期
2014-10-01
DOI
10.1016/j.solmat.2014.08.046

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