Imaging single atoms using secondary electrons with an aberration-corrected electron microscope

Published 2009 View Full Article

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Title
Imaging single atoms using secondary electrons with an aberration-corrected electron microscope
Authors
Keywords
-
Journal
NATURE MATERIALS
Volume 8, Issue 10, Pages 808-812
Publisher
Springer Nature
Online
2009-09-21
DOI
10.1038/nmat2532

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