Imaging single atoms using secondary electrons with an aberration-corrected electron microscope

标题
Imaging single atoms using secondary electrons with an aberration-corrected electron microscope
作者
关键词
-
出版物
NATURE MATERIALS
Volume 8, Issue 10, Pages 808-812
出版商
Springer Nature
发表日期
2009-09-21
DOI
10.1038/nmat2532

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