Nanoscale holographic interferometry for strain measurements in electronic devices

标题
Nanoscale holographic interferometry for strain measurements in electronic devices
作者
关键词
-
出版物
NATURE
Volume 453, Issue 7198, Pages 1086-1089
出版商
Springer Nature
发表日期
2008-06-19
DOI
10.1038/nature07049

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