Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films

Kelvin probe force microscopy and electrostatic force microscopy responses to the polarization in a ferroelectric thin film: Theoretical and experimental investigations

(2013) M. Cuniot-Ponsard   JOURNAL OF APPLIED PHYSICS

Quantification of the dielectric constant of single non-spherical nanoparticles from polarization forces: eccentricity effects

(2013) G Gomila et al.   NANOTECHNOLOGY

Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe

(2012) G Gramse et al.   NANOTECHNOLOGY

Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces

(2012) Laura Fumagalli et al.   NATURE MATERIALS

Nanoscale microwave microscopy using shielded cantilever probes

(2011) Keji Lai et al.   Applied Nanoscience

Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

(2010) L. Fumagalli et al.   APPLIED PHYSICS LETTERS

Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

(2010) C. Riedel et al.   PHYSICAL REVIEW E

Quantitative Nanoscale Dielectric Microscopy of Single-Layer Supported Biomembranes

(2009) Laura Fumagalli et al.   NANO LETTERS

Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy

(2009) G Gramse et al.   NANOTECHNOLOGY

Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

(2008) Y. Shen et al.   ENGINEERING ANALYSIS WITH BOUNDARY ELEMENTS

Nanoscale capacitance microscopy of thin dielectric films

(2008) G. Gomila et al.   JOURNAL OF APPLIED PHYSICS