Kelvin probe force microscopy and electrostatic force microscopy responses to the polarization in a ferroelectric thin film: Theoretical and experimental investigations

Orientation-dependent surface potential behavior in Nb-doped BiFeO3

(2012) F. Yan et al.   APPLIED PHYSICS LETTERS

Local surface potential distribution and its relaxation in ferroelectric poly(vinylidenefluoride-co-trifluoroethylene) thin films

(2012) Hyunwoo Choi et al.   APPLIED PHYSICS LETTERS

Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions

(2012) Robert Baier et al.   PHYSICAL REVIEW B

Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

(2012) Ali Sadeghi et al.   PHYSICAL REVIEW B

Landau-Ginzburg-Devonshire theory for electromechanical hysteresis loop formation in piezoresponse force microscopy of thin films

(2011) A. N. Morozovska et al.   JOURNAL OF APPLIED PHYSICS

Simultaneous characterization of the electro-optic, converse-piezoelectric, and electroabsorptive effects in epitaxial (Sr,Ba)Nb2O6 thin films

(2011) M. Cuniot-Ponsard et al.   JOURNAL OF APPLIED PHYSICS

Electric field and surface charge effects on ferroelectric domain dynamics in BaTiO3single crystal

(2011) D. Y. He et al.   PHYSICAL REVIEW B

Path-related unexpected injection charges in BaTiO3 ferroelectric thin films studied by Kelvin force microscopy

(2010) Huifen Guo et al.   APPLIED PHYSICS LETTERS

Ferroelectric microdomains and microdomain arrays recorded in strontium–barium niobate crystals in the field of atomic force microscope

(2010) Tatiana R. Volk et al.   JOURNAL OF APPLIED PHYSICS

Simulation method of Kelvin probe force microscopy at nanometer range and its application

(2010) A. Masago et al.   PHYSICAL REVIEW B

Kelvin probe force microscopy and its application

(2010) Wilhelm Melitz et al.   SURFACE SCIENCE REPORTS

Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

(2008) Franck Bocquet et al.   PHYSICAL REVIEW B