Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy

Published 2013 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 24, Issue 23, Pages 235708
Publisher
IOP Publishing
Online
2013-05-15
DOI
10.1088/0957-4484/24/23/235708

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.