Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy

出版年份 2013 全文链接

标题

作者

关键词

出版物

Volume 24, Issue 23, Pages 235708

出版商

IOP Publishing

发表日期

2013-05-15

DOI

10.1088/0957-4484/24/23/235708

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