A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements

标题
A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements
作者
关键词
-
出版物
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 31, Issue 2, Pages 025011
出版商
IOP Publishing
发表日期
2015-12-21
DOI
10.1088/0268-1242/31/2/025011

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