Atomic-Scale Tomography: A 2020 Vision

Atom probe crystallography

(2012) Baptiste Gault et al.   Materials Today

Prospects for Nanobiology with Atom-Probe Tomography

(2012) Thomas F. Kelly et al.   MRS BULLETIN

The second revolution in atom probe tomography

(2012) Thomas F. Kelly et al.   MRS BULLETIN

Electron tomography at 2.4-ångström resolution

(2012) M. C. Scott et al.   NATURE

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

(2012) M.J. Humphry et al.   Nature Communications

Atom probe trajectory mapping using experimental tip shape measurements

(2011) D. HALEY et al.   JOURNAL OF MICROSCOPY

Kinetic-Energy Discrimination for Atom Probe Tomography

(2011) Thomas F. Kelly   MICROSCOPY AND MICROANALYSIS

Toward Atomic-Scale Tomography: The ATOM Project

(2011) T Kelly et al.   MICROSCOPY AND MICROANALYSIS

An Atom-Probe Tomography Primer

(2011) David N. Seidman et al.   MRS BULLETIN

Nanoscale chemical tomography of buried organic–inorganic interfaces in the chiton tooth

(2011) Lyle M. Gordon et al.   NATURE

Three-Dimensional Imaging in Aberration-Corrected Electron Microscopes

(2010) Huolin L. Xin et al.   MICROSCOPY AND MICROANALYSIS

Optimized Laser Thermal Pulsing of Atom Probe Tomography: LEAP 4000X™

(2010) J Bunton et al.   MICROSCOPY AND MICROANALYSIS

The Atom TOMography (ATOM) Concept

(2010) MK Miller et al.   MICROSCOPY AND MICROANALYSIS

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Advances in the reconstruction of atom probe tomography data

(2010) B. Gault et al.   ULTRAMICROSCOPY

An electron tomography algorithm for reconstructing 3D morphology using surface tangents of projected scattering interfaces

(2009) T.C. Petersen et al.   COMPUTER PHYSICS COMMUNICATIONS

Atom probe tomography

(2009) M.K. Miller et al.   MATERIALS CHARACTERIZATION

A System for Simulation of Tip Evolution Under Field Evaporation

(2009) BP Geiser et al.   MICROSCOPY AND MICROANALYSIS

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

(2009) U. Dahmen et al.   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

Niobium superconducting strip line detectors (SSLD) for time-of-flight mass spectroscopy (TOF-MS)

(2009) N. Zen et al.   PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS

Ultrafast ion detection by superconducting NbN thin-film nanowire detectors for time-of-flight mass spectrometry

(2008) K. Suzuki et al.   PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS

Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy

(2008) K. W. Urban   SCIENCE

3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP

(2007) J.S. Moore et al.   ULTRAMICROSCOPY

An electron microscope for the aberration-corrected era

(2007) O.L. Krivanek et al.   ULTRAMICROSCOPY