Operation of TEAM I in a User Environment at NCEM

Fully Automated Measurement of the Modulation Transfer Function of Charge-Coupled Devices above the Nyquist Frequency

(2012) Wouter Van den Broek et al.   MICROSCOPY AND MICROANALYSIS

KSpaceNavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysis

(2011) T. Duden et al.   ULTRAMICROSCOPY

Transmission electron microscopy at 20kV for imaging and spectroscopy

(2011) U. Kaiser et al.   ULTRAMICROSCOPY

Optimum HRTEM image contrast at 20kV and 80kV—Exemplified by graphene

(2011) Z. Lee et al.   ULTRAMICROSCOPY

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

(2010) M. Haider et al.   MICROSCOPY AND MICROANALYSIS

Characterisation of a CMOS active pixel sensor for use in the TEAM microscope

(2010) Marco Battaglia et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Direct Imaging of Soft−Hard Interfaces Enabled by Graphene

(2009) Zonghoon Lee et al.   NANO LETTERS

Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy

(2009) Marco Battaglia et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

(2009) U. Dahmen et al.   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

Graphene at the Edge: Stability and Dynamics

(2009) C. O. Girit et al.   SCIENCE

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

(2008) C. Kisielowski et al.   MICROSCOPY AND MICROANALYSIS

Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM

(2007) M. Haider et al.   ULTRAMICROSCOPY