The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM

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The Canadian Centre for Electron Microscopy: a national facility for ultrahigh resolution electron microscopy

(2008) Gianluigi A. Botton   International Journal of Nanotechnology

Atomic-Resolution STEM in the Aberration-Corrected JEOL JEM2200FS

(2008) Robert F. Klie et al.   MICROSCOPY AND MICROANALYSIS

Coordination-dependent surface atomic contraction in nanocrystals revealed by coherent diffraction

(2008) W. J. Huang et al.   NATURE MATERIALS

Sub-ångström-resolution diffractive imaging of single nanocrystals

(2008) W. J. Huang et al.   Nature Physics

An electron microscope for the aberration-corrected era

(2007) O.L. Krivanek et al.   ULTRAMICROSCOPY