The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

标题
The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 16, Issue 02, Pages 183-193
出版商
Cambridge University Press (CUP)
发表日期
2010-02-26
DOI
10.1017/s1431927610000085

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