Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope

Published 2010 View Full Article

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Title
Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope
Authors
Keywords
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Journal
MICROSCOPY AND MICROANALYSIS
Volume 16, Issue 05, Pages 604-613
Publisher
Cambridge University Press (CUP)
Online
2010-07-16
DOI
10.1017/s1431927610000292
References
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