Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures

Published 2009 View Full Article

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Title
Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 15, Issue S2, Pages 130-131
Publisher
Cambridge University Press (CUP)
Online
2009-07-27
DOI
10.1017/s143192760909895x

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