Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures

出版年份 2009 全文链接

标题

作者

关键词

出版物

Volume 15, Issue S2, Pages 130-131

出版商

Cambridge University Press (CUP)

发表日期

2009-07-27

DOI

10.1017/s143192760909895x

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