Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

Published 2014 View Full Article

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Title
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 54, Issue 9-10, Pages 1697-1701
Publisher
Elsevier BV
Online
2014-08-05
DOI
10.1016/j.microrel.2014.07.070

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