Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor

Title
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
Authors
Keywords
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Journal
MICROELECTRONICS RELIABILITY
Volume 53, Issue 7, Pages 956-963
Publisher
Elsevier BV
Online
2013-05-06
DOI
10.1016/j.microrel.2013.04.002

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