4.3 Article

Low temperature bonding technology for 3D integration

Journal

MICROELECTRONICS RELIABILITY
Volume 52, Issue 2, Pages 302-311

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2011.03.038

Keywords

-

Ask authors/readers for more resources

3D integration provides a promising solution to achieve system level integration with high function density, small form factor, enhanced transmission speed and low power consumption. Stacked bonding is the key technology to enable the communication between different strata of the 3D integration system. Low temperature bonding approaches are explored in industry to solve the performance degradation issue of the integrated devices. In this paper, various low temperature bonding technologies are reviewed and introduced, as well as the latest developments in world-wide companies and research institutes. The outlook for industrial application is also addressed in the paper. (C) 2011 Elsevier Ltd. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.3
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available