The influence of ferroelectric–electrode interface layer on the electrical characteristics of negative-capacitance ferroelectric double-gate field-effect transistors

Title
The influence of ferroelectric–electrode interface layer on the electrical characteristics of negative-capacitance ferroelectric double-gate field-effect transistors
Authors
Keywords
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Journal
MICROELECTRONICS RELIABILITY
Volume 52, Issue 4, Pages 757-760
Publisher
Elsevier BV
Online
2011-11-24
DOI
10.1016/j.microrel.2011.11.006

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