An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown

Published 2011 View Full Article

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Title
An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 51, Issue 9-11, Pages 1535-1539
Publisher
Elsevier BV
Online
2011-07-25
DOI
10.1016/j.microrel.2011.06.035

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