Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic

Published 2010 View Full Article

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Title
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 51, Issue 3, Pages 536-542
Publisher
Elsevier BV
Online
2010-11-17
DOI
10.1016/j.microrel.2010.10.011

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