Role of stress voltage on structural degradation of GaN high-electron-mobility transistors

Authors

Keywords

Journal

Volume 51, Issue 2, Pages 201-206

Publisher

Elsevier BV

Online

2010-09-21

DOI

10.1016/j.microrel.2010.08.021

Discuss science. Find collaborators. Network.

Join a conversation

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started