AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress

Published 2010 View Full Article

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Title
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 51, Issue 2, Pages 207-211
Publisher
Elsevier BV
Online
2010-10-09
DOI
10.1016/j.microrel.2010.09.024

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