Accelerated testing for failures of tantalum capacitors

Published 2009 View Full Article

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Title
Accelerated testing for failures of tantalum capacitors
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 50, Issue 2, Pages 217-219
Publisher
Elsevier BV
Online
2009-12-03
DOI
10.1016/j.microrel.2009.11.006

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