Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy

Published 2010 View Full Article

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Title
Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 50, Issue 9-11, Pages 1398-1406
Publisher
Elsevier BV
Online
2010-08-23
DOI
10.1016/j.microrel.2010.07.136

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