Reliability- and process-variation aware design of integrated circuits

Published 2008 View Full Article

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Title
Reliability- and process-variation aware design of integrated circuits
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 48, Issue 8-9, Pages 1114-1122
Publisher
Elsevier BV
Online
2008-08-16
DOI
10.1016/j.microrel.2008.07.039

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