Journal
MICROELECTRONICS RELIABILITY
Volume 48, Issue 11-12, Pages 1815-1821Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2008.07.067
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The MIL-Spec-based helium fine leak test (test condition A(2)) and test condition AD is reviewed for its applicability to packages with sub-micro liter cavity volumes. The existing gas conduction models are utilized to investigate the validity of the criteria defined in the test guidelines in terms of true leak rates. The application domains valid under the current guidelines are determined as a function of the internal cavity volume. The results show that the test is valid only for a finite domain of true leak rates when the volume is smaller than 10(-2) cm(3) and the invalid domain increases as the cavity volume decreases. (C) 2008 Published by Elsevier Ltd.
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