Advanced thermal failure analysis and reliability investigations – Industrial demands and related limitations

Published 2008 View Full Article

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Title
Advanced thermal failure analysis and reliability investigations – Industrial demands and related limitations
Authors
Keywords
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Journal
MICROELECTRONICS RELIABILITY
Volume 48, Issue 8-9, Pages 1273-1278
Publisher
Elsevier BV
Online
2008-08-13
DOI
10.1016/j.microrel.2008.06.020

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