Statistical insight into controlled forming and forming free stacks for HfOx RRAM

Published 2013 View Full Article

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Title
Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 109, Issue -, Pages 177-181
Publisher
Elsevier BV
Online
2013-03-24
DOI
10.1016/j.mee.2013.03.065

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