The thickness of native oxides on aluminum alloys and single crystals

Title
The thickness of native oxides on aluminum alloys and single crystals
Authors
Keywords
Aluminum alloy, Aluminum single crystal, Thin native oxide film thickness, Electrochemical impedance spectroscopy, X-ray reflectivity, X-ray photoelectron spectroscopy
Journal
APPLIED SURFACE SCIENCE
Volume 349, Issue -, Pages 826-832
Publisher
Elsevier BV
Online
2015-05-16
DOI
10.1016/j.apsusc.2015.05.043

Ask authors/readers for more resources

Reprint

Contact the author

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started