The thickness of native oxides on aluminum alloys and single crystals

标题

作者

关键词

Aluminum alloy, Aluminum single crystal, Thin native oxide film thickness, Electrochemical impedance spectroscopy, X-ray reflectivity, X-ray photoelectron spectroscopy

出版物

APPLIED SURFACE SCIENCE

Volume 349, Issue -, Pages 826-832

出版商

Elsevier BV

发表日期

2015-05-16

DOI

10.1016/j.apsusc.2015.05.043

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