Stimulated N-doping of reduced graphene oxide on GaN under excimer laser reduction process

Graphene oxide coated on GaN was simultaneously reduced and doped with nitrogen via excimer laser irradiation. Nitrogen dopant was originated from the GaN during the laser-induced dissociation at high energies. This phenomenon was confirmed by the absence of C-N bond formation in laser irradiated graphene oxide on SiO2. A top-gated field-effect transistor based on laser reduction of graphene oxide channel on GaN showed n-type behavior via the gate voltage modulation. The present findings indicate a paradigm for the formation of graphene-nitride semiconductor interfaces. (C) 2013 Elsevier B.V. All rights reserved.