4.7 Article

Microstructure and texture evolution of Cu-Nb composite wires

Journal

MATERIALS CHARACTERIZATION
Volume 81, Issue -, Pages 124-133

Publisher

ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2013.04.013

Keywords

Cu-Nb composite; Microstructure; Texture; Electron backscatter diffraction; Transmission electron microscopy

Funding

  1. National Natural Science Foundation of China [51031002, 51201188]
  2. China Scholarship Council (CSC)
  3. US NSF [DMR-0084173]
  4. US DOE
  5. State of Florida

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The evolution of microstructure and texture in Cu-Nb composite wires fabricated by an accumulative drawing and bundling process was investigated by backscattered electron (BSE), electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). Results indicate the onset of severe curling and shape changing occurred at the size of Nb similar to 400 nm with a surface increase of about 6.91 mu m(2)/mu m(3) (the area per unit volume). Two kinds of grain boundaries in Nb are suggested: one is 20 degrees-50 degrees boundary with a rotate/tilt axis around < 110 > parallel to drawing direction (DD), and another is >50 degrees boundary with the axis perpendicular to DD. The curling phenomenon occurred at the Cu-Nb interface and is related not only to the deformation mechanism of Nb but also to the presence of interface. This result is distinct from reported works showing that curling takes place when BCC metals are heavily drawn (Area reduction >73%). The variation in microstructure and texture evolution between Cu and Nb filaments was discussed based on the differences in deformation mechanisms of these two metals. (C) 2013 Elsevier Inc. All rights reserved.

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